In Structured Illumination Microscopy (SIM) an increase in resolution is achieved by varying the excitation intensity as a function of location by means of different illumination patterns. In practice, the excitation beam pattern illuminates the sample from different directions and in different phases. Fourier analysis of the two-dimensional images measured in this way can significantly increases the resolution in the x-y plane. With this imaging method 33 fps can be achieved, that enables the system for detection of dynamics. The disadvantage of this method is the extreme sensitivity to the quality of the illuminating structure. The microscope is available in nano-bio-imaging core facility, is also suitable for living-cell studies as it is equipped with a CO2 and temperature incubator.
Microscope: Zeiss Elyra S.1
Objectives: Plan-Neofluar 10x/0.30, Plan-APO 40x/1.4 Oil, Plan-Apochromat 63x/1.40 Oil, Alpha Plan-APO 100x/1.46 Oil
Lasers: 405 nm, 488 nm, 561 nm és 642nm
Filters: 405nm excitation (MBS 405 + EF BP 420-480 / LP 750), 488nm excitation (MBS 488 + EF BP 495-550 / LP 750), 561nm excitation (MBS 561 + EF BP 570-620 / LP 750), 642nm excitation (MBS 642 + EF LP 655)
Camera: Andor iXon EMCCD